The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2003

Filed:

May. 17, 2000
Applicant:
Inventor:

Lance M. Bodnar, San Diego, CA (US);

Assignee:

TRW Inc., Redondo Beach, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/300 ;
U.S. Cl.
CPC ...
H03M 1/300 ;
Abstract

A method for generating correction codes that can correct a single error and detect two adjacent errors in an information word for a range of (n, k) values, where k denotes the length of the information word in bits and n denotes the length of the coded information word in bits. The method generates a parity check matrix, then multiplies a received word by the parity check matrix to produce a syndrome corresponding to one of two mutually exclusive sets of syndromes if the word contains at least one error. Information in the word is corrected by inverting a bit containing an error if the produced syndrome corresponds to one of the sets of syndromes. An uncorrectable two bit adjacent error is reported if the produced syndrome corresponds to the other of the two sets of syndromes and no error is reported if the produced syndrome contains all zeros.


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