The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2003
Filed:
Feb. 09, 2000
Applicant:
Inventors:
Craig Alan Friske, San Jose, CA (US);
John Marland Garth, Gilroy, CA (US);
James Alan Ruddy, Gilroy, CA (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/730 ;
U.S. Cl.
CPC ...
G06F 1/730 ;
Abstract
A technique for identifying changes in a data store connected to a computer. Initially, one or more interval changes are measured. Each interval change indicates an amount of change in the data store at an interval. Next, a data store change is estimated that indicates an amount of change in the data store across all of the intervals using each interval change.
Friske, Craig. (2003). Method of estimating an amount of changed data over plurality of intervals of time measurements (U.S. Patent No. 6535870). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6535870
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