The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2003
Filed:
Oct. 04, 1999
Didier Louis, Fontainebleau, FR;
Andre Steimle, Evry, FR;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A diagnostic method engages all the neurons of an artificial neural network (ANN) based on mapping an input space defined by vector components based on category, context, and actual field of influence (AIF). The method includes the steps loading the components of a first and second input vectors into the ANN; engaging all the neurons of a same prototype; having all the neurons compute their own distance between the respective prototypes and the second input vector (which should be the same if the neurons were good); determining the minimum distance Dmin and comparing Dmin with a distance D measured between the first and the second input vectors. If Dmin<D, it is indicative that at least one failing neuron exists (i.e., either the distance, the category or the AIF value differs from a predetermined expected value), in which case the failing neuron is isolated. If Dmin≧D, the good neurons of the ANN are deselected, preventing the good neurons from further learning/recognition processing; and repeating the previous steps until the ANN is empty. The present method provides a fast and inexpensive integrity diagnostic of the neurons forming an ANN at the cost of only a few logic gates.