The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2003
Filed:
Sep. 29, 2000
Eric Malcolm Grace, Cooper City, FL (US);
Coulter International Corp., Miami, FL (US);
Abstract
A method for analyzing an abnormal particle population in an experimental sample containing particles involves a particle property distribution index based on an average particle property (e.g., size) distribution curve for multiple normal samples in a particle analysis instrument. The process involves producing an experimental particle property distribution curve by analyzing an experimental sample containing particles in the instrument. The distribution curve of the experimental sample is analyzed to identify particle populations at the lower or upper region of the experimental distribution curve that differ from particle populations in the regions of an average particle property distribution curve. Thereafter, the number of particles within the lower or upper region of the experimental distribution curve that differs from the average curve is determined and employed for diagnosis of a relevant characteristic of the particle population. A computer program which makes calculations for such methods can be employed or can be integrated into a particle analysis instrument. The method, program, and instruments of this invention provide a novel red blood cell parameter.