The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2003

Filed:

Oct. 30, 2001
Applicant:
Inventors:

Thomas M. Hedges, Great Falls, VA (US);

Hiro Takagi, Ashburn, VA (US);

Timothy Pratt, Blacksburg, VA (US);

Michael J. Sobel, Annandale, VA (US);

Assignee:

Arc Second, Inc., Dulles, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/126 ; G01C 1/00 ;
U.S. Cl.
CPC ...
G01B 1/126 ; G01C 1/00 ;
Abstract

An improved three-dimensional position detector and measurement system includes one or more transmitters that each transmit planar light beams and a strobe pulse and a receiver that responds to illumination from the beams and the strobe. The receiver in the system includes calibration logic for executing a quadratic mathematical algorithm to uniquely characterize said planar beams of each of said optical transmitters active in said measurement field. In one embodiment, the quadratic mathematical algorithm uses cones to represent the scan path of the planar beams.


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