The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2003
Filed:
Sep. 14, 2000
Franz Lampersberger, Aschheim, DE;
Karsten Wendt, Obertshausen, DE;
Bernd Tielebörger, München, DE;
Rainer Tutsch, München, DE;
Peter Rakitsch, Moosburg, DE;
Hans Joachim Six, München, DE;
Jörg Sierks, München, DE;
MAN Roland Druckmaschinen AG, , DE;
Abstract
A measurement device is described for the quality control of printed products, having a pair of optical channels that differ in their properties and operate simultaneously. Each optical channel comprises an illumination channel for illuminating a measurement location and a reflection channel that picks up the light reflected from the measurement location. The reflected light is directed to an evaluation unit, which is connected to the reflection channel, that analyzes the reflected radiation spectrally. Polarization filters arranged in one of the pairs of channels provides the difference in the optical properties between the two pairs of channels. The measuring device provides an increased number of obtainable measured values for further processing in a way that requires only a modest increase in the metrological outlay compared to other measuring devices of this type.