The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2003
Filed:
Jun. 27, 2001
Antti Ruha, Oulu, FI;
Tarmo Ruotsalainen, Oulu, FI;
Jussi-Pekka Tervaluoto, Oulu, FI;
Jani Kauppinen, Oulu, FI;
Nokia Corporation, Espoo, FI;
Abstract
Disclosed is a method and apparatus for performing Dynamic Element Matching (DEM). The method operates to input a plurality of digital values and, for each value, to generate a plurality of N signals individual ones of which are intended to drive one of a plurality of N elements. The plurality of signals are generated so as to average the usage of individual ones of the N elements over time. The method further periodically rearranges the plurality of N signals so as to suppress the generation of undesired periodicities or tones in the usage of the N elements, and without affecting the averaging of the usage of the N elements. Preferably the periodic rearrangement occurs only at a time when the usage of the N elements is indicated as being averaged using, for example, an enable signal that is input to a secondary DEM block from a primary DEM block. The plurality of N signals are preferably generated by the primary DEM block using a cyclic DEM algorithm, such as a Data Weighted Averaging (DWA) algorithm or a rotation-based Clocked Averaging (CLA) algorithm, and the periodic rearrangement performed by the secondary DEM block is preferably based on randomization or pseudo-randomization.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile