The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2003
Filed:
May. 12, 2000
Applicant:
Inventor:
Benedict L. Zin, San Diego, CA (US);
Assignee:
Mizuho USA, Inc., Poway, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/3543 ;
U.S. Cl.
CPC ...
G01N 3/3543 ;
Abstract
A competitive assay strip and method of rapid competitive assay incorporating an additional step, allowing optimization or at least substantial improvement of conditions for competition between analyte conjugates and analytes or alternatively, binding of analyte, which is tailored to each particular analyte.
Zin, Benedict. (2003). Rapid assay strip and method of rapid competitive assay (U.S. Patent No. 6534324). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6534324
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile