The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2003

Filed:

Jan. 08, 1999
Applicant:
Inventors:

Rajesh Bhikhu Parekh, Near Wendlebury, GB;

Paul Nicholas Goulding, Cambridgeshire, GB;

Dale Robert Pfost, Pennington, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/3543 ;
U.S. Cl.
CPC ...
G01N 3/3543 ;
Abstract

A method for analyzing a sample containing a plurality of analytes, comprises labelling the analytes with a detectable label, the label being chosen such that its detectability can be influenced by modifying the conditions of detection; separating the labelled analytes, before or after labeling,; and determining the presence of the separated analytes under the modified conditions and also, if desired, the unmodified conditions. Suitable detection apparatus comprises a support for a gel, means for detecting one or more analytes in the gel, and means for reducing the temperature of the gel to below ambient temperature, e.g., to no more than 0°C.


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