The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2003

Filed:

Jun. 22, 2000
Applicant:
Inventors:

Jeffrey M. Dils, Chandler, AZ (US);

Daniel B. Nelson, Chandler, AZ (US);

John E. Nemazi, Bloomfield Hills, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 3/20 ; G01B 3/50 ;
U.S. Cl.
CPC ...
G01B 3/20 ; G01B 3/50 ;
Abstract

A molded limit gauge for measuring workpiece thicknesses. The limit gauge includes a body having one or more elongate ridges extending longitudinally therealong. Each ridge has a plurality of notches extending laterally through its upper portion. Each notch has a unique longitudinal dimension that is uniform. In a first preferred embodiment of the invention, the bottom surface of each notch and the land between each notch is horizontally flat. In a second preferred embodiment, each of these surfaces has a configuration of a laterally convex curve. The limit gauge body is configured such that it can be mounted atop a planing machine. So mounted, it can function as a structural top of the planing machine. Measurement of a board thickness is accomplished by attempting to slide the board through notches that appear to match its thickness. A range of board thickness is defined between the indicated sizes of two adjacent notches that respectively allow and do not allow passage of the board through. When a number of different workpieces, such as boards, are to be planed, they can readily be measured and sorted into similarly sized groups before being planed so that a minimum number of planing machine adjustments need be made. A third embodiment includes jaws that extend into the notches. The jaws are resiliently biased against workpieces inserted into notches. Their positions are indicated on a dial indicator to facilitate determining workpiece dimensions that differ somewhat from those of the notches.


Find Patent Forward Citations

Dils, Jeffrey. (2003). Measuring apparatus for planer (U.S. Patent No. 6532677). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6532677

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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