The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2003

Filed:

Jun. 09, 1999
Applicant:
Inventor:

Shigeyuki Miyamoto, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/700 ;
U.S. Cl.
CPC ...
G06F 1/700 ;
Abstract

There is provided a method of assessing total environmental load of an object product, including the steps of (a) collecting first data about environmental load at each of nodes relating to the object product, the first data including second data for retrieving data about environmental load of other node to which the each of nodes has a direct link, (b) retrieving the first data directly associated with the object product, in accordance with a predetermined condition, (c) recursively retrieving other first data about environmental load, based on second data included in the first data having been retrieved in the step (b), and (d) calculating total environmental load based on the first data having been retrieved in the steps (b) and (c). The method makes it possible to input data about environmental load with ease relative to a conventional method, and also to assess environmental load about a product comprised of a plurality of parts.


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