The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2003

Filed:

Dec. 04, 2000
Applicant:
Inventor:

Masataka Miwa, Nagoya, JP;

Assignee:

Toho Gas Co., LTD, Nagoya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 3/44 ;
U.S. Cl.
CPC ...
G01B 3/44 ;
Abstract

A method for estimating the life of an apparatus under a random stress amplitude variation, involving determining a probability density function of a cumulated damage quantity and estimating the life of the apparatus on the basis of the probability density function, characterized by: approximating a damage coefficient indicative of a damage quantity per unit by a linear expression when the random stress amplitude variation is in a narrow band; and representing the random stress amplitude variation &sgr;(t)(instantaneous) in terms of the sum of a time averaged value &sgr;(t)(mean) and a stochastic variation &sgr;′.


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