The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2003

Filed:

Oct. 21, 1998
Applicant:
Inventors:

Hongche Liu, Fremont, CA (US);

Shyam Kuttikkad, Fremont, CA (US);

Assignee:

Tele Atlas North America, Inc., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 ; G06K 9/48 ;
U.S. Cl.
CPC ...
G06K 9/46 ; G06K 9/48 ;
Abstract

A system is disclosed for identifying matching arcs in sets of geometric objects, such as a pair of electronic maps, without relying on attributes being assigned to the arcs. An arc in a first set of geometric objects is identified as matching an arc in a second set of geometric objects, when the arc in the first set is co-bounded on both sides by polygons which match the corresponding co-bounding polygons of the arc in the second set. A determination is made of which polygons in the first set of geometric objects match polygons in the second set of geometric objects, by computing and comparing a set of similarity metrics. Examples of characteristics for which similarity metrics are determined include, proximity, area, shape and rotation. Each similarity metric is determined in an isolated fashion, so that no other metric is reflected in the metric being measured.


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