The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2003
Filed:
Mar. 29, 2001
Applicant:
Inventor:
Juergen Pensel, Altstätten, CH;
Assignee:
Leica Microsystems AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/100 ;
U.S. Cl.
CPC ...
G02B 2/100 ;
Abstract
The invention concerns a stand for a microscope ( ), having an X-Y displacement unit ( ), a stand beam ( ), a stand column ( ), and a stand foot ( ), the X-Y displacement unit ( ) being no longer arranged, as before, in the region of microscope ( ), but rather removed therefrom in the direction of the stand column ( ). The X-Y displacement unit thus carries at least a part of the stand beam ( ). The location of the center of gravity on the stand is thereby favorably influenced. Both the stand beam ( ) and the stand foot ( ) can be small.