The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2003

Filed:

May. 06, 1999
Applicant:
Inventors:

Michael J. Ransford, Arnold, MD (US);

Minh T. Nguyen, Laurel, MD (US);

Michael G. Taylor, Laurel, MD (US);

Jeffrey C. Livas, Millersville, MD (US);

Vipul Bhatnagar, Kensington, MD (US);

Assignee:

Ciena Corporation, Linthicum, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/006 ; H04B 1/008 ;
U.S. Cl.
CPC ...
H04B 1/006 ; H04B 1/008 ;
Abstract

An apparatus and method are provided for monitoring the Q-factor of a plurality of main signals that are simultaneously transmitted across a fiber optic line using wave division multiplexing. In particular, the includes an optical tap, a tunable optical bandpass filter, and a Q-detection circuit. The optical tap operates to tap the fiber optic line to provide a plurality of tapped signals corresponding to the plurality of main signals. The tunable optical bandpass filter acts to select one of the plurality of tapped signals, by only passing a selected signal in a chosen channel frequency band. The Q-detection circuit then determines the Q-factor of the selected signal. This operation can be performed sequentially for each of the plurality of tapped signals to provide a measure of the Q-factor for each of the plurality of main signals. This operation can also be continually repeated to provide a constant measurement of the Q-factor of each of the plurality of main signals.


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