The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2003
Filed:
Apr. 27, 2001
Masami Shirai, Saitama, JP;
Kiyoshi Araki, Kanagawa, JP;
Pentax Corporation, Tokyo, JP;
Abstract
A surveying instrument includes an optical distance meter which has a light-transmitting optical system and a light-receiving optical system, the light-receiving optical system including a light-receiving element; a first wavelength selection filter and a second wavelength selection filter for allowing only light within a first wavelength range to pass therethrough, to be thereafter incident on the light-receiving element, wherein the first wavelength selection filter allows light with a wavelength equal to or greater than a first specific wavelength to pass therethrough, and a second wavelength selection filter allows light with a wavelength equal to or shorter than a second specific wavelength, which is longer than the first specific wavelength, to pass therethrough; and an angle adjusting device for adjusting an angle of inclination of the first and second wavelength selection filter with respect to an optical path thereof.