The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2003

Filed:

Nov. 21, 2000
Applicant:
Inventor:

Wen-hsiung Lee, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/385 ; G01D 1/506 ; G03G 1/501 ;
U.S. Cl.
CPC ...
B41J 2/385 ; G01D 1/506 ; G03G 1/501 ;
Abstract

Imaging offset problems in imaging systems, such as electrophotographic (EPG) printers and copiers, are overcome. Imaging offset results from misaligned exposure units that, when uncompensated, produce dots on a photoreceptor belt at exposure positions that are offset from ideal dot positions. An imaging-offset compensating method of the invention first determines the imaging offset, which is a distance that may include a magnitude and a direction. The imaging offset is determined with respect to the ideal dot position. A time factor is then determined based on the magnitude of the imaging offset for each exposure unit. The time at which each exposure unit is actuated is modified by a respective time factor so that a dot produced by each exposure unit matches the ideal dot location thereof.


Find Patent Forward Citations

Lee, Wen-hsiung. (2003). Imaging-offset compensation methods and systems (U.S. Patent No. 6532029). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6532029

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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