The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2003
Filed:
Dec. 15, 1999
Applicant:
Inventors:
James D. Pruet, Garland, TX (US);
Kerry A. Wilson, Royse City, TX (US);
Assignee:
Northrop Grumman Corporation, Los Angeles, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 5/16 ; G01D 5/34 ; G01J 1/42 ;
U.S. Cl.
CPC ...
H01J 5/16 ; G01D 5/34 ; G01J 1/42 ;
Abstract
An optical test system ( ) for testing one or more detectors includes a signal generator ( ) operable to generate an optical signal. The test system ( ) also includes an aperture system ( ) operable to regulate an intensity of the optical signal. The test system ( ) further includes a signal distributor ( ) coupled to the aperture system ( ) and operable to distribute the optical signal to a plurality of optical connections ( ). Each optical connection ( ) is coupled to a detector.