The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6530268 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 11, 2003

Filed:

May. 15, 2001
Applicant:
Inventor:

James R. Massie, Santa Barbara, CA (US);

Assignee:

Veeco Instruments, Inc., Plainview, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/28 ; G01B 7/34 ;
U.S. Cl.
CPC ...
G01B 5/28 ; G01B 7/34 ;
Abstract

An metrology apparatus includes an actuator with a first actuator stage to controllably move in first and second orthogonal directions, and a second actuator stage adjacent to the first actuator stage to controllably move in a third direction orthogonal to the first and second orthogonal directions. A coupling is coupled to the second actuator stage and to a multi-bar linkage assembly fixed to a second end of a reference structure. The second actuator stage and the coupling move the linkage in the third orthogonal direction in a manner that substantially isolates the linkage from any second actuator stage motion in the first and second directions. An objective is fixed to the second end of the reference structure and located between a light source and a position sensor. The position sensor measures first actuator stage motion in the first and second directions.


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Massie, James. (2003). Apparatus and method for isolating and measuring movement in a metrology apparatus (U.S. Patent No. 6530268). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6530268

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