The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2003

Filed:

Aug. 03, 2000
Applicant:
Inventor:

Yoshinori Matsuyama, Aichi, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/20 ;
U.S. Cl.
CPC ...
G01B 5/20 ;
Abstract

A target lens shape measuring device for measuring a target lens shape of an eyeglass lens has a measuring section including: a template feeler contactable with a periphery of a template; a first supporting base to which the template feeler is attached; a first motor and a link mechanism that move the template feeler and the first supporting base between a measuring position and a retracted position, wherein the link mechanism located between the measuring position and the retracted position is engaged with the first supporting base, and the link mechanism located at the measuring position is disengaged with the first supporting base; a second motor that moves the template feeler and the first supporting base in a radius vector direction of the template; and a first encoder that detect an amount of movement of the template feeler and the first supporting base in the radius vector direction of the template. A calculating section obtains radius vector information of the template based on the amount of movement detected by the first encoder.


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