The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2003
Filed:
Feb. 23, 2000
Eiji Hasegawa, Kanagawa-ken, JP;
Yoshikatu Hatagaki, Kanagawa-ken, JP;
Ayumi Ishii, Kanagawa-ken, JP;
Hidekazu Saito, Kanagawa-ken, JP;
Masaki Kume, Kanagawa-ken, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
There are provided a semiconductor device and a function module test method, capable of reducing the test time of function modules and reducing the number of test pins. This semiconductor device is formed so as to make test inputs and test outputs of a plurality of function modules having the same function respectively common, conduct tests on arbitrarily selected function modules simultaneously in parallel, and give a pass/fail decision on the semiconductor device including the function modules on the basis of results of comparison between a test result of arbitrary one function module and test results of other function modules.