The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2003
Filed:
Nov. 30, 2000
Applicant:
Inventors:
Randall L. Barbour, Glen Head, NY (US);
Harry L. Graber, Brooklyn, NY (US);
Assignee:
The Research Foundation of State University of New York, Albany, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/900 ; G01N 2/100 ;
U.S. Cl.
CPC ...
G06F 1/900 ; G01N 2/100 ;
Abstract
A system and method for determining the relative losses and/or efficiencies of the individual channels of a multi-channel measurement system, such as a multi-channel optical tomography system. The system and method provide several independent estimates of the losses associated with each of the plurality of source and detector components, whereby statistical analysis of the independent estimates can be used to reveal system errors or misalignments.
Barbour, Randall. (2003). Instrumentation calibration protocol (U.S. Patent No. 6529846). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6529846
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile