The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2003

Filed:

May. 24, 2001
Applicant:
Inventor:

Naoyuki Hori, Kyoto-fu, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/00 ;
U.S. Cl.
CPC ...
G21K 1/00 ;
Abstract

When X-rays are projected to an X-ray sensor through a grid, a pitch of slits on the grid has a relationship such that a length obtained by multiplying an odd number to a half pitch of a projection image on the X-ray sensor is equal to a pitch of detection pixels of the X-ray sensor. X-rays passing through a sample to be measured via the grid are detected by the X-ray sensor. Levels of the detected X-ray detection signals are inputted into an operation process portion and subjected to an equalizing process for every pixel groups, each having even number of the detection pixels, continuously lined up in a pitch direction of the grid. As a result, irregularities of the levels of the X-ray detection signals can be corrected, and moires generated on an output screen of an image display portion can be removed.


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