The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2003
Filed:
May. 09, 2000
Applicant:
Inventor:
Shigeki Ishii, Tokyo, JP;
Assignee:
Ando Electric Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G01R 3/126 ; G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G01R 3/126 ; G01R 3/102 ;
Abstract
In a circuit of an IC testing apparatus in which a wave-form of a pattern signal outputted from a pattern generator is shaped and timing of the pattern signal is adjusted so that a testing signal is created and a device to be tested is made to carry out a predetermined processing according to the testing signal 10 and the quality of the device to be tested is judged by comparing an obtained output signal with an expecting processing result, the pattern signal is outputted from AND gate to TG/FC circuit in Write Mode, and DEN control signal is outputted from AND gate to TG/FC circuit by inverting Write/Read change-over signal by an inverter in Read Mode.