The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2003
Filed:
Apr. 30, 1999
Applicant:
Inventors:
Dieter Härle, München, DE;
Patrick Heyne, München, DE;
Martin Buck, München, DE;
Assignee:
Infineon Technologies AG, München, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract
A configuration for testing a plurality of memory chips on a wafer, in which needles are used to supply the memory chips with supply voltages, an initialization signal, a read signal, a clock signal as well as address, data and control signals. The address, data and control signals are in this case produced by a logic device disposed in an edge area of the memory chip and are supplied directly to the memory chips.