The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2003

Filed:

Nov. 06, 2000
Applicant:
Inventor:

Arno Nauerth, Erlenbach, DE;

Assignee:

Bruker Medical GmbH, Rheinstetten, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

The invention concerns a method for correcting linear field inhomogeneities in a magnetic resonance apparatus. After an excitation pulse and application of a phase gradient in a predetermined direction, a data point is taken after a fixed, predetermined time t . This is repeated for systematically changed strengths of the phase gradient and constant t . The phase gradient with maximum measuring signal corresponds to a field correction gradient in the corresponding direction.


Find Patent Forward Citations

Nauerth, Arno. (2003). Method of correcting linear field inhomogeneities in a magnetic resonance apparatus (U.S. Patent No. 6528999). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6528999

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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