The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2003
Filed:
Nov. 21, 2000
Sung Chul Shin, Taejon-si, KR;
Sug Bong Choe, Taejon-si, KR;
Korea Advanced Institute of Science & Technology, Taejon-Si, KR;
Abstract
A magneto-optical microscope magnetometer capable of simultaneously measuring a hysteresis loop and activation magnetic moment of a submicrometer-scale local area (about 0.3×0.3 &mgr;m). An electromagnet capable of applying a magnetic field to a magnetic material is attached to a polarizing optical microscope capable of observing a magnetized state of the magnetic material, such that images of the microscope varying with the strength of the applied magnetic field are grabbed in real time by a charge coupled device camera and then analyzed. The magneto-optical microscope magnetometer can measure a hysteresis loop and activation magnetic moment in a submicrometer-scale local area observed by the polarizing optical microscope. Further, the magneto-optical microscope magnetometer can measure hysteresis loops and activation magnetic moments simultaneously with respect to all CCD pixels of the camera and observe coercivity and activation magnetic moment distributions of the entire magnetic material.