The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2003

Filed:

Oct. 20, 2000
Applicant:
Inventors:

Chin-Tu Chen, Lisle, IL (US);

Xiaochuan Pan, Chicago, IL (US);

Chien-Min Kao, Wilmette, IL (US);

Assignee:

Arch Development Corporation, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/164 ;
U.S. Cl.
CPC ...
G01T 1/164 ;
Abstract

A method and apparatus are provided for reconstructing images from data obtained from scintillation events occurring within a projection space of a depth-of-interaction positron emission tomography system. The method includes the steps of identifying a segment of each depth-of-interaction detector of respective pairs of depth-of-interaction detectors detecting the scintillation-events of the data obtained within the projection space and estimating a set of sinograms from the data based upon a set of depth-independent point spread functions of the identified segments of the respective pairs of depth-of-interaction detectors.


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