The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2003

Filed:

Aug. 03, 2000
Applicant:
Inventors:

Yoshikazu Nakayama, Hirakata-shi, Osaka, JP;

Akio Harada, Osaka, JP;

Seiji Akita, Izumi, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 7/00 ; G01B 5/28 ; B23Q 1/709 ; G01N 1/902 ; G01N 2/175 ;
U.S. Cl.
CPC ...
G21K 7/00 ; G01B 5/28 ; B23Q 1/709 ; G01N 1/902 ; G01N 2/175 ;
Abstract

The fusion-welded nanotube surface signal probe of the present invention is constructed from a nanotube, a holder which holds the nanotube, a fusion-welded part fastening a base end portion of the nanotube to a surface of the holder by fusion-welding, a tip end portion of the nanotube being caused to protrude from the holder; and the tip end portion is used as a probe needle so as to scan surface signals. This fusion-welded nanotube surface signal probe can be used as a probe in AFM (Atomic Force Microscope), STM (Scanning Tunneling Microscope), other SPM (Scanning Probe icroscope) and so on.


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