The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2003
Filed:
May. 11, 2001
Hideo Yokota, Wako, JP;
Akitake Makinouchi, Wako, JP;
Toshiro Higuchi, Yokohama, JP;
Yutaka Yamagata, Wako, JP;
Riken, , JP;
Abstract
A sample extrusion device for sequentially extruding a sample in a predetermined direction, a sample cutting device for sequentially cutting the extruded sample, and a con-focal image pickup device for focusing an illuminating light at a section portion that was cut to pick up two-dimensional images of the cut section from a reflected light thereof are provided to reconstruct an internal structure of the sample from many two-dimensional images (continuous section images) that differ in the cutting positions. The sample can be continuously cut to continuously observe the sectional images thereof under no influence of the sample being seen transparently, the entirety of the sample can be observed in almost the same condition even though the sample is colored with a fluorescent dye, and thereby, the internal structure of the sample can be reconstructed with a high precision.