The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2003

Filed:

Sep. 29, 2000
Applicant:
Inventors:

Bruce J. Badding, Ballston Lake, NY (US);

Christopher J. Farral, Greenville, SC (US);

Linda J. Farral, Greenville, NC (US);

George H. Ghanime, Balllston Spa, NY (US);

David M. Johnson, Simpsonville, SC (US);

Govindarajan Rengarajan, Latham, NY (US);

Peter J. Röhl, Clifton Park, NY (US);

Mullahalli V. Srinivas, Niskayuna, NY (US);

Julia A. Wagener, Simpsonville, SC (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ; G06T 1/530 ; G09G 5/00 ; F28F 7/00 ;
U.S. Cl.
CPC ...
G06F 1/750 ; G06T 1/530 ; G09G 5/00 ; F28F 7/00 ;
Abstract

A system and method for analyzing a baseline geometry and, optionally, a modified geometry. The method can include generating a numerical representation of a baseline geometry having baseline elements identified with first identifiers or element identifiers, and then assigning second identifiers or analyzer identifiers to the elements. A selected characteristic of the geometry, such as structural loading, is analyzed with reference to the second or analyzer identifiers. At least one of the elements of the geometry can then be altered in a manner that at least partially automatically adjusts the surrounding geometry, and the same first identifier or element identifier is associated with the altered element as was associated with the baseline, unaltered element. The altered geometry can be analyzed with respect to a third identifier (or another analyzer identifier) and a correspondence between the identifiers, the baseline element, and the altered element can be established and maintained. Accordingly, the boundary conditions and/or the mesh applied to the baseline geometry can be automatically applied to the altered geometry by referring to the first or element identifiers. Therefore, the time and effort required to analyze the altered geometry can be reduced when compared to the effort typically required by conventional methods.


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