The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2003

Filed:

Mar. 29, 2000
Applicant:
Inventors:

Yeu-Kuang Hwu, Tapai, TW;

Jung Ho Je, Nam-Ku, Pohang -City 790-390, KR;

Giorgio Margaritondo, CH-1018 Lausanne, CH;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/00 ;
U.S. Cl.
CPC ...
G21K 1/00 ;
Abstract

A new radiography method which utilizes contrast enhancement mechanisms with highly collimated X-ray beams without optics to achieve high imaging resolution and improve the time resolution is disclosed. This invention includes irradiating the object with an unmonochromatized beam, specifically highly collimated synchrotron radiation, and detecting an unmonochromatized beam image after the unmonochromatized beam has passed through the object. With compact design, a system for imaging an object with very high resolution, X-ray radiography with a wide range of X-ray sources, such as synchrotron radiation, without any sophisticated X-ray optics is also disclosed. This invention may achieve real-time images with micrometer resolution.


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