The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2003

Filed:

Jul. 22, 1999
Applicant:
Inventor:

Makoto Yamazaki, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/256 ;
U.S. Cl.
CPC ...
H04L 1/256 ;
Abstract

In a quality monitoring apparatus for monitoring the quality of ATM cells stored in a buffer, a programmable counter is provided for decrementing a count value in response to each cell forwarded from the buffer to define a time window of variable size. Responsive to each cell discarded from the buffer, a predetermined value is added to the count value of the programmable counter to produce a summed value and the programmable counter is updated with the summed value. A cell loss counter increments its count value in response to each cell that is discarded from the buffer within the time window. A decision circuit produces a low quality signal when the count value of the cell loss counter is greater than a threshold value.


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