The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2003
Filed:
Mar. 20, 2002
Kabushiki Kaisha Topcon, , JP;
Abstract
The present invention relates to an apparatus for precise measurement of optical characteristics, and has an object to provide an optical characteristic measuring apparatus comprising a position change unit for changing the positions of beams transformed by a first transforming member, wherein a first light source emits a luminous flux of a first wavelength, a first illumination optical system illuminates a minute area on the retina of the eye under examination with the luminous flux from the first light source, a first light receiving optical system leads light to a first light receiving unit through a transforming member for transforming the luminous flux having undergone at least one of transmission and reflection at at least one surface of the object of measurement into at least nine beams, a position change unit changes the positions of the beams transformed by the first transforming member, and an arithmetic unit can determine optical characteristics of the object of measurement based on a first signal from the first light receiving unit corresponding to the angle of inclination of the luminous flux.