The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2003

Filed:

Mar. 30, 2000
Applicant:
Inventor:

Rudolf Grosskopf, D-89551 Konigsbronn, DE;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/124 ;
U.S. Cl.
CPC ...
G01B 1/124 ;
Abstract

An apparatus for examining an object in three dimensions including an optical system having an illumination side and an observation side; an illumination grid located in an illumination plane on the illumination side of the optical system and which during use generates an array of illumination points that is projected by the optical system onto a focus plane at a site at which the object is located, the optical system in turn directing light from that site into an observation plane on the observation side of the optical system, the illumination grid being a first aperture plate having a first passive array of pinholes; a detector array of light-sensitive regions located on the observation side of the optical system; and a second aperture plate located between the detector array and the optical system, said second aperture plate having a second passive array of pinholes.


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