The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2003
Filed:
Jan. 21, 2000
Takashi Morikawa, Kakogawa, JP;
Hiroyuki Inoue, Kakogawa, JP;
Kimiyo Kubo, Kakogawa, JP;
Yoshiro Ikeuchi, Kobe, JP;
Sysmex Corporation, Hyogo, JP;
Abstract
A particle analyzing apparatus outputs a measurement result with high reliability with respect to a measurement item. The particle analyzing apparatus includes a measuring part, a judgement processing part, and an output part. The measuring part includes a fluid part, a control part, a first measuring part, a second measuring part, a hystogram preparing part, and a scattergram preparing part. The fluid part sucks up a blood sample in a test tube by a pipette. The control part controls the fluid part, the first measuring part, and the second measuring part. Measurement data measured by the first measuring part and the second measuring part are sent to the judgement processing part, and after judgement is made in the judgement processing part, a measurement result is outputted by the output part. The first measuring part makes measurement on the basis of an impedance system, and the second measuring part makes measurement on the basis of a flow cytometory system.