The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2003
Filed:
Dec. 27, 2001
Conrad Rose, King George, VA (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
This present invention advantageously eliminates the critical deficiencies of current multipath interferometer processing demonstrated in field testing. In particular the present invention substantially improves AOA estimation accuracy and reliability when utilizing super resolution algorithms. The present invention also overcomes the data-gap drawback of data editing methods, especially for emitters at low elevations. The present invention does this by detecting phase processing errors and substituting correct AOA estimates for the corrupt ones. In the preferred implementation, the detection and substitution time extends only slightly the super resolution or data editing processing time. By thus requiring little additional processing time, the present invention allows the interferometer to output accurate angle estimates at the receiver's emitter-revisit rate for all emitter-array geometries and signal polarizations. The present invention eliminates both the gross errors caused by abnormally large phase noise variance, typically created by diffuse multipath, and the interfering signal errors induced by specular multipath.