The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6525544 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 25, 2003

Filed:

Feb. 15, 2001
Applicant:
Inventor:

Kenji Okada, Toyonaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01H 3/112 ; G01R 3/126 ; H01L 2/100 ;
U.S. Cl.
CPC ...
H01H 3/112 ; G01R 3/126 ; H01L 2/100 ;
Abstract

A total injected electron quantity Q , which has reached a constant value against a variation in stress voltage applied to an insulating film for use in a semiconductor device, is obtained as a critical injected electron quantity Q . The total injected electron quantity Q is a total quantity of electrons injected into the insulating film before the film causes a dielectric breakdown. Thereafter, a time it should take for a total quantity of electrons, injected into the insulating film under actual operating conditions of the device, to reach the critical injected electron quantity Q is estimated as the expected lifetime of the insulating film.


Find Patent Forward Citations

Okada, Kenji. (2003). Method for predicting lifetime of insulating film and method for reliability testing of semiconductor device (U.S. Patent No. 6525544). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6525544

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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