The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2003
Filed:
Sep. 19, 2000
Falko De Gruyter, Wunstorf, DE;
Hans-Hermann Higgen, Stadthagen, DE;
Luther & Maelzer GmbH, Wunstorf, DE;
Abstract
Printed circuit boards are tested in accordance with a method in which the circuit boards ( ) are brought into contact with conducting test-contact elements ( ) at certain contact points ( ) which are connected to the conductor tracks ( ), the test-contact elements ( ) or a partial number thereof are connected, in succession in clock-pulsed manner according to a certain test program, to a test-voltage source ( ) and during each test clock pulse the flowing via the test-contact elements ( ) or a parameter related thereto is measured. Particularly for circuit boards ( ) to be tested having a high contact-point density, the testing-time can be shortened by the circuit boards being subdivided into a plurality of test areas and all or at least some of the test areas being tested in parallel. The method is especially suitable for circuit boards that are produced in a multiple panel.