The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2003
Filed:
Feb. 22, 2001
Applicant:
Inventors:
Abdellatif Bellaouar, Dallas, TX (US);
Ahmed R. Fridi, Dallas, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/334 ;
U.S. Cl.
CPC ...
G01R 1/334 ;
Abstract
A method for lowering the spurious output of a sample and hold phase detector includes the steps of charging a ramp node ( ) to a first voltage level after a sample period ( ) has occurred. After the ramp node ( ) is charged to the first voltage level, the ramp node is charged to a second voltage level during period ( ). By precharging the ramp node ( ) during the hold period ( ), it reduces any leakage current in the SH switch ( ), which minimizes any voltage drift thereby improving the spurious performance of the SH phase detector ( ).