The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6524248 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 25, 2003

Filed:

Oct. 09, 2001
Applicant:
Inventor:

James K. Bullis, Sunnyvale, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 ;
U.S. Cl.
CPC ...
A61B 8/00 ;
Abstract

The present invention solves a problem that has been a barrier to development of high resolution ultrasonic imaging. It is based on an analysis that formulates the 5 problem of wave propagation in an inhomogeneous medium as a summation of an ideal wave and distortion waves. This analysis then leads to an apparatus that includes a forward propagation apparatus that enables measurement of the distortion waves and determination of corrections that are applied to originally received signals such that the ideal wave is left as the only basis for the final output signal. After signals are corrected, basic beamforming processes work as if the propagation medium was homogeneous such that ideal high resolution performance is achievable. The method is generally useful for improving any form of wave propagation system that is disturbed by inhomogeneities in the medium.


Find Patent Forward Citations

Bullis, James. (2003). Aberration correction by measurement and suppression of distortion waves (U.S. Patent No. 6524248). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6524248

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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