The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2003
Filed:
Jun. 08, 2001
Kenneth A. Knox, Kearney, MO (US);
Ronald Jay Nelson, Platte City, MO (US);
Terry L. Bellmore, Kansas City, MO (US);
Gregory Lee Carlock, LaFayette, GA (US);
Variform Inc., Kearney, MO (US);
Abstract
A vertical impact testing apparatus comprises a rigid frame, an anvil connected to the frame, a dart positioned above the anvil, and a dropped-weight mechanism slidably connected to the frame. The frame is comprised of a vertical column, a base, and a guide rail. The vertical column extends for a sufficient distance to securely support a weight assembly through travel from various heights for testing a specimen. To facilitate downward travel of the dropped-weight mechanism at a proper vertical orientation, a guide block is rigidly attached to the weight assembly and the dropped-weight mechanism is slidably mounted to the guide rail. The dart is stabilized by a braced support arm connected to the frame and a bearing acting cooperatively to ensure impact of the dart with the specimen is in the vertical plane and without tilt. The anvil is a solid structure, fixed in position, which contacts and supports the specimen on a side opposite of the dart as the dart impacts the substrate and forces it downward.