The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2003
Filed:
Oct. 18, 2000
Parviz Yavari, Huntington Beach, CA (US);
Tiencheng Wang, Rolling Hills E., CA (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
A method for selecting a suitable workpiece having a material composition and a thickness for forming an article. The method calculates expected strain resulting from straight bends, stretch flanges, and shrink flanges utilizing customized strain correlations developed from strain test data of work piece samples. The calculated straight bend strain and stretch flange strain from multiple bends are then compared with the material yield strain to determine workpiece suitability. The shrink flange strain is compared with the material buckle stain to determine workpiece suitability. The method also calculates a spring back deformation for determining suitability of the workpiece and the press forming procedures.