The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2003

Filed:

Feb. 12, 2001
Applicant:
Inventor:

Shih-Yuan Wang, Palo Alto, CA (US);

Assignee:

Gazillion Bits, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/02 ;
U.S. Cl.
CPC ...
G02B 6/02 ;
Abstract

A method of fabricating a microstructured optical fiber is described in which a plurality of solid silica wafers are generated corresponding to longitudinally consecutive portions of the optical fiber, separately etched with void patterns in a lithographic process, and bonded together into a preform. The preform is then drawn to form the optical fiber. The lithographic process used to form the void patterns in the wafers may be any of several processes currently or prospectively used in VLSI fabrication. Such lithographic process may be used because the wafers comprise silica glass or other material common in VLSI devices and, in accordance with a preferred embodiment, are generated with thicknesses highly amenable to such fabrication methods. The wafers are preferably generated by creating a preliminary preform having the desired material refractive index profile using conventional preform fabrication methods, the wafers then being sliced from the preliminary preform. Other methods such as flame hydrolysis process or a chemical vapor deposition process may also be used to generate the wafers.


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