The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2003

Filed:

Dec. 06, 1999
Applicant:
Inventors:

Masatomo Norikane, Kobe, JP;

Masayuki Katayama, Miki, JP;

Assignee:

Sysmex Corporation, Kobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 ;
U.S. Cl.
CPC ...
G06K 9/46 ;
Abstract

A particle image analyzer that facilitates display by designating on a distribution an image desired to be displayed from among a large number of recorded images is disclosed. The particle image analyzer is provided with a parameter computation means for computing at least one characterizing parameter for respective particle images obtained by image capture; a storing means for storing correlations between the particle images and the characterizing parameters with regard to the respective particle images; distribution-diagram generation means for generating characteristic-parameter distribution diagram; designation means for designating the area within the distribution diagram; read-out means for reading out from the memory means particle images corresponding to characterizing parameters within the areas designated by the designation means; and display means for displaying the read-out particle images.


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