The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2003

Filed:

Nov. 09, 2001
Applicant:
Inventors:

Sharon Wang, Brookfield, WI (US);

Stephen Metz, Greenfield, WI (US);

Thomas Toth, Brookfield, WI (US);

Piero U. Simoni, New Berlin, WI (US);

Jianying Li, New Berlin, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 ;
U.S. Cl.
CPC ...
A61B 6/03 ;
Abstract

A method and apparatus for performing image reconstruction using data obtained by an N beam helical scan, the method including generating projection data arrays for each of the N row in a CT detector, weighting the data arrays using a unique weighting function that is applicable to detectors having many different numbers of rows N to generate helical weighted arrays for each row, weighting the helical weighted arrays by applying a conjugate weighting function to generate conjugate arrays for each detector row and then combining the conjugate weighted arrays, filtering and back-projecting to generate a slice image.


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