The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2003

Filed:

Mar. 14, 2001
Applicant:
Inventors:

Tetsuo Kuwabara, Urawa, JP;

Masaaki Nakabayashi, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/03 ;
U.S. Cl.
CPC ...
G02F 1/03 ;
Abstract

A diffraction optical element comprises a substrate, a diffraction grating formed on the substrate with a material with low ultraviolet resistance and an ultraviolet screening means arranged on the substrate at a position closer to the incident light receiving side of the optical element relative to the diffraction grating. The ultraviolet screening means comprises a dielectric multilayer film and is formed on the other side of the substrate than the side carrying the diffraction grating. Alternatively, the ultraviolet screening means may be provided as a separate member from a diffraction optical element and arranged at a position closer to the incident light receiving side of the diffraction optical element in an optical system.


Find Patent Forward Citations

Loading…