The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2003
Filed:
Apr. 30, 1999
Applicant:
Inventors:
Zifu Wang, Irvine, CA (US);
George R. Rossman, Pasadena, CA (US);
Geoffrey A. Blake, Pasadena, CA (US);
Assignee:
California Institute of Technology, Pasadena, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 ;
U.S. Cl.
CPC ...
G01J 3/28 ;
Abstract
A tunable spectrometer configured to microsample minute samples of dimension on the order of 10 &mgr;m or less. A tunable optical parametric oscillator laser is used to produce a sampling beam and a reference beam for measuring the absorption of the samples.
Quick Actions:
Wang, Zifu. (2003). Apparatus and method for analyzing microscopic samples based on optical parametric oscillation (U.S. Patent No. 6522402). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6522402
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile