The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2003

Filed:

Aug. 11, 1999
Applicant:
Inventors:

Christopher R Lawrence, Farnborough, GB;

John R Sambles, Exeter, GB;

Assignee:

Qinetiq Limited, London, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/74 ; G06K 5/00 ;
U.S. Cl.
CPC ...
G06K 9/74 ; G06K 5/00 ;
Abstract

A signature recognition system for identifying an article with a distinctive diffraction element (or elements) and verifying the presence of that element or elements comprising: an article with one or more diffraction gratings impressed thereon, the grating(s) exhibiting periodic wave surface profiles having a depth-to-pitch ratio &dgr; of between 0.1 and 0.5, a source of polarized electromagnetic radiation of wavelength &lgr; such that the pitch G of the periodic wave surface profile of the grating(s) is comparable to an integer multiple n of that wavelength, a device for directing the source of polarized electromagnetic radiation to the surface of the grating(s) at a plane of incidence substantially normal to the plane of the surface of the diffraction grating and at an angle of approximately 45° azimuth to the alignment of the grooves on the surface, and a device for detecting radiation reflected from the grating(s) surface which is oppositely polarized to the incident radiation.


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