The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2003
Filed:
Oct. 25, 2000
Applicant:
Inventors:
Hilmar Meek Warenius, Wirral, GB;
Laurence Anthony Seabra, Wirral, GB;
Assignee:
TheRyte Limited, Liverpool, GB;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ;
U.S. Cl.
CPC ...
C12Q 1/68 ;
Abstract
Provided is a method for measuring the sensitivity of a cancer cell to an anticancer agent, which method comprises testing a sample for the mutational status, expression, and/or function of a negative signal transduction factor (NSTF), and testing the sample for the mutational status, expression, and/or function of a positive signal transduction factor (PSTF), wherein when the method comprises measuring the radiosensitivity of wild-type p53 cancer cells by testing a sample comprising wild-type p53 cells or an extract therefrom for the abundance of Raf-1 protein by Western blotting, an antibody specific to Raf-1 protein is employed.